The application of Artificial Neural Network for the assessment of thermal properties of multi-layer semiconductor structure

TL;DR

This paper presents a method using artificial neural networks to identify thermal properties of multi-layer semiconductor structures by fitting experimental data with complex contrast characteristics.

Contribution

It introduces a neural network-based approach for accurately determining thermal properties from experimental data in multi-layer structures.

Findings

Neural network effectively identifies thermal properties.

Method improves accuracy of thermal property estimation.

Applicable to complex multi-layer semiconductor structures.

Abstract

In this paper, the solution of the problem of identification of thermal properties of investigated multi-layer structure is presented. In order of that, artificial neural network was used to find the set of thermal properties for which the complex contrast characteric derived fits the best to the one evaluated basing upon experimenatal data.