Measurement of single electron emission in two-phase xenon
B. Edwards, H. M. Araujo, V. Chepel, D. Cline, T. Durkin, J. Gao, C., Ghag, E. V. Korolkova, V. N. Lebedenko, A. Lindote, M. I. Lopes, R. Luscher,, A. St. J. Murphy, F. Neves, W. Ooi, J. Pinto da Cunha, R. M. Preece, G., Salinas, C. Silva, V. N. Solovov, N. J. T. Smith
TL;DR
This study measures the electroluminescence response of single electrons in a two-phase xenon detector, providing insights relevant for dark matter detection and future detector design.
Contribution
First measurement of single-electron electroluminescence in a two-phase xenon detector, with analysis of pressure dependence and potential photoionization effects.
Findings
Single-electron response matches previous electroluminescence yield data.
Pressure dependence of the response is characterized.
Photoionization may contribute to single-electron signals.
Abstract
We present the first measurements of the electroluminescence response to the emission of single electrons in a two-phase noble gas detector. Single ionization electrons generated in liquid xenon are detected in a thin gas layer during the 31-day background run of the ZEPLIN-II experiment, a two-phase xenon detector for WIMP dark matter searches. Both the pressure dependence and magnitude of the single-electron response are in agreement with previous measurements of electroluminescence yield in xenon. We discuss different photoionization processes as possible cause for the sample of single electrons studied in this work. This observation may have implications for the design and operation of future large-scale two-phase systems.
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