Localization and characterization of simple defects in finite-size photonic crystals

TL;DR

This paper introduces a tomographic algorithm using Green's functions and Born approximation to localize and characterize defects in finite photonic crystals, aiding in their monitoring and revealing potential super-resolution capabilities.

Contribution

The paper presents a novel, simple tomographic method for defect localization in finite photonic crystals using Green's functions and Born approximation.

Findings

Algorithm successfully localizes defects in simulations.

Potential for focalization beyond Rayleigh limit demonstrated.

Method serves as a first step for monitoring structured materials.

Abstract

Structured materials like photonic crystals require for optimal use a high precision both on position and optical characteristics of the components which they are made of. Here, we present a simple tomographic algorithm, based on a specific Green's function together with a first-order Born approximation, which enables us to localize and characterize identical defects in finite-size photonic crystals. This algorithm is proposed as a first step to the monitoring of such materials. Illustrative numerical results show in particular some possibility of focalization beyond the Rayleigh criterion.