Setup for shot noise measurements in carbon nanotubes
Fan Wu, Leif Roschier, Taku Tsuneta, Mikko Paalanen, Taihong Wang,, Pertti Hakonen

TL;DR
This paper presents a specialized measurement setup for shot noise in high impedance carbon nanotubes, operating at 600-900 MHz, enabling effective noise analysis despite non-matching conditions.
Contribution
The paper introduces a high-frequency noise measurement setup tailored for high impedance carbon nanotubes, accommodating non-matching conditions to facilitate shot noise studies.
Findings
Successful construction of a 600-900 MHz measurement setup
Ability to measure shot noise in high impedance nanotubes
Tolerance of non-matching conditions in measurements
Abstract
We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 - 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non-matching conditions can be tolerated.
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