Diamond thin Film Detectors for Beam Monitoring Devices

TL;DR

This paper demonstrates the use of polycrystalline CVD diamond strip sensors as effective beam monitors for heavy ion beams, providing precise transverse profile and bunch length measurements in radiation-hard conditions.

Contribution

It introduces a novel application of diamond thin film sensors for beam monitoring, highlighting their capability to measure beam profile and bunch length with high precision.

Findings

Diamond sensors can withstand high radiation doses from heavy ion beams.

The sensors accurately determine transverse beam profiles to a fraction of strip pitch.

Timing measurements yield bunch length with millimeter resolution.

Abstract

Diamonds offer radiation hard sensors, which can be used directly in primary beams. Here we report on the use of a polycrystalline CVD diamond strip sensor as beam monitor of heavy ion beams with up to 2.10^9 lead ions per bunch. The strips allow for a determination of the transverse beam profile to a fraction of the pitch of the strips, while the timing information yields the longitudinal bunch length with a resolution of the order of a few mm.