Performance of the Charge Injection Capability of Suzaku XIS
H. Nakajima, H. Yamaguchi, H. Matsumoto, T. G. Tsuru, K. Koyama, H., Tsunemi, K. Hayashida, K. Torii, M. Namiki, S. Katsuda, M. Shoji, D., Matsuura, T. Miyauchi, T. Dotani, M. Ozaki, H. Murakami, M. W. Bautz, S. E., Kissel, B. LaMarr, G. Y. Prigozhin

TL;DR
This paper evaluates the charge injection technique for Suzaku XIS, demonstrating its ability to accurately measure charge transfer inefficiency and improve spectral resolution through in-orbit and ground experiments.
Contribution
It introduces a reliable charge injection method for measuring column-dependent charge losses, enhancing spectral calibration accuracy for the XIS instrument.
Findings
Charge injection provides stable, precise charge transfer measurements.
Column-dependent CTI correction improves spectral line width.
Charge injection reduces low energy tail in calibration spectra.
Abstract
A charge injection technique is applied to the X-ray CCD camera, XIS (X-ray Imaging Spectrometer) onboard Suzaku. The charge transfer inefficiency (CTI) in each CCD column (vertical transfer channel) is measured by the injection of charge packets into a transfer channel and subsequent readout. This paper reports the performances of the charge injection capability based on the ground experiments using a radiation damaged device, and in-orbit measurements of the XIS. The ground experiments show that charges are stably injected with the dispersion of 91eV in FWHM in a specific column for the charges equivalent to the X-ray energy of 5.1keV. This dispersion width is significantly smaller than that of the X-ray events of 113eV (FWHM) at approximately the same energy. The amount of charge loss during transfer in a specific column, which is measured with the charge injection capability, is…
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